Research & Development

Research & Development Equipment of Central Research Institute

Baosteel Central Research Institute's advanced research equipment and technologies are available to technical professionals from all product divisions of Baosteel. Its major equipment includes field-emission transmission electron microscopy (TEM), field-emission scanning electron microscopy (SEM), field-emission electron probe micro-analyzer (EPMA), X ray photoelectron spectroscopy (XPS), and Auger electron spectroscopy (AES).

Testing and Research Support Center


500kg vacuum induction furnace

A multi-functional vacuum induction furnace provided by CONSARC with additional functions such as top-bottom combined blowing and powder blowing as compared with standard vacuum induction furnaces, it can simulate different refining units for smelting and production process development of sophisticated products with high alloy and low contents of impurities.


Hot rolling test unit

The unit can be applied for conducting rolling tests concerning high-alloy, corrosion-resistant, and high-strength steel grades as well as for research of new processes such as controlled rolling and controlled cooling, quenching, ferritic rolling, duplex rolling, and recrystallization control.

Generic Technology Research Center


X-ray diffractometer (D8 DISCOVER)

Supplied by Bruker AXS, it is featured by functions such as micro-area positioning, polycrystalline material structure analysis, phase analysis, grain orientation analysis, and lattice constant calculation, applicable to structure analysis, phase analysis, grain orientation analysis as well as grain size estimation of metallic materials such as silicon steel.


Creep testing machine

Working within a temperature range from 300¡æ to 1100¡æ, it is used for high-temperature creep and rupture tests of metallic materials to determine rupture strength and creep properties.


Scanning electron microscopy

Zeiss Ultra 55 is a field-emission scanning electron microscopy that is applicable for analyses of nano materials, precipitated phases and morphology, quantity and distribution of inclusions. Used in combination with the energy disperse spectroscopy (EDS) and EBSD, it can achieve a comprehensive analysis of microstructures, compositions and crystal structures of materials.


Field emission transmission electron microscopy (JEM-2100F)

Used for product mechanism research, it can conduct analyses of energy spectrums, structures and compositions as well as observations of fine structures of crystals and defects inside crystals.


X-ray fluorescence spectrophotometer (ARL 9900XP)

Supplied by Thermo Fisher Scientific, it can be applied for fast composition analysis of medium and high alloy and surface composition analysis of coated product samples. Based on UniQuant, it can perform fast qualitative analyses on samples with unknown components.


ELEMENT 2/XR ICP-MS (Element II)

Supplied by Thermo Fisher Scientific, it can be used for quantitative analysis of ultratrace elements in solution samples (with the limit of detection of 1pg / mL to 1ng / mL). It is applied for quantitative analysis of elements that are less than 1¦Ìg/g in metal samples.